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解决方案

SYNOPSYS™15.96 版本发布

The update to version 15.96 incorporates the following changes:

Features:

1. If you by accident enter an APS number that exceeds the number of surfaces in the lens, the program will now inform you and put it on surface 1.

2. We have deactivated mode switch 55, which controlled whether the diffraction image analysis used a coarse or fine sample pattern. PCs are so fast these days that it makes no sense to use the coarse sample anymore.

3. SFIT now lets you specify the coordinate system in which surface sag data are presented. So if the measuring technician does not have the X and Y axes oriented the same as in SYNOPSYS, it will convert.

4. The FN command can now make a plot showing how the F/number varies over the field.

Bugs Fixed:

1. CPLOT did not work properly.

2. The help file section on GRIN lenses was incomplete.

3. If a ZFILE lens has fewer then four zooms assigned, the program will now default to the power-series expansion. (The cubic form requires four or more zooms.)

4. The CCF (channel capacity fraction) analysis spaced the image samples at twice the correct distance.

5. If the ILLUM command encountered field points at which no rays get through, it would plot those points off-screen. Now it zeros them out.

6. The new DSENS option in DSEARCH only worked in Q mode.